IEEE International Integrated Reliability Workshop (IIRW)

The IEEE International Integrated Reliability Workshop (IIRW) is a conference focusing on microelectronics reliability, including device-level reliability, circuit and system reliability, memory reliability, and reliability characterization and testing. It has technical sponsorship from IEEE and aims for proceedings to be indexed in major databases such as Scopus, Web of Science, Ei Compendex, DBLP, and Google Scholar.