Italia
2026
Informazioni
The 39th International Conference on Microelectronic Test Structures is a conference for presenting scientific results related to test structures in micro- and nano-electronics. It gathers designers and users of test structures to discuss characterization techniques, design, fabrication, and future directions in a one-track program, with opportunities for interaction with equipment vendors. The event has IEEE technical sponsorship and aims for indexing in major databases.
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