39th International Conference on Microelectronic Test Structures (ICMTS)

The 39th International Conference on Microelectronic Test Structures is a conference for presenting scientific results related to test structures in micro- and nano-electronics. It gathers designers and users of test structures to discuss characterization techniques, design, fabrication, and future directions in a one-track program, with opportunities for interaction with equipment vendors. The event has IEEE technical sponsorship and aims for indexing in major databases.