Италия
2026
Информация
The 39th International Conference on Microelectronic Test Structures is a conference for presenting scientific results related to test structures in micro- and nano-electronics. It gathers designers and users of test structures to discuss characterization techniques, design, fabrication, and future directions in a one-track program, with opportunities for interaction with equipment vendors. The event has IEEE technical sponsorship and aims for indexing in major databases.
Всегда проверяйте детали на официальном сайте перед подачей заявки. Нашли ошибку? Сообщите нам.