30th International Symposium on VLSI Design and Test (VDAT)

The 30th International Symposium on VLSI Design and Test (VDAT) is a conference focusing on advanced research in VLSI, semiconductor devices, and intelligent hardware systems, covering topics from device to system level. It includes digital, analog, and mixed-signal circuit design and optimization, low-power and high-performance architectures, and heterogeneous SoC platforms, as well as innovations in EDA, CAD, and AI/ML-based design automation. The event highlights new device technologies, packaging technologies, and related reliability and thermal/power considerations, with technical sponsorship from IEEE.